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Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites
Advanced Functional Materials ( IF 18.5 ) Pub Date : 2020-06-18 , DOI: 10.1002/adfm.202002201
Yongtao Liu 1, 2 , Matthias Lorenz 1 , Anton V. Ievlev 1 , Olga S. Ovchinnikova 1
Affiliation  

Metal halide perovskite (MHP) solar cells have attracted much attention due to the rapidly growing power conversion efficiency that has reached 25.2% in a decade, comparable to established commercial photovoltaic modules. Compositional engineering is one of the most effective methods to boost the performance of MHP solar cells. Further improving the efficiency and the stability of MHP solar cells necessitates good understanding of the chemical–efficiency correlation and the chemical evolution during the degradation of MHP solar cells. In this regard, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool to investigate the chemical aspect of MHPs and has played an important role in advancing the development of MHP optoelectronics. However, up to date, a review that can guide future utilization of ToF‐SIMS in the MHP development is missing. Herein, the capabilities of ToF‐SIMS in MHP investigations are summarized and analyzed from simple material synthesis and chemical distribution to more complicated device operation mechanism and stability. The strength of ToF‐SIMS in resolving important issues in this field, such as interface composition, ion migration, and degradation in MHP is highlighted. Finally, an outlook with an emphasis on making the utmost of ToF‐SIMS in developing MHP devices is provided.

中文翻译:

二次离子质谱(SIMS)用于金属卤化物钙钛矿的化学表征

由于金属卤化物钙钛矿(MHP)太阳能电池的功率转换效率迅速提高,十年内已达到25.2%,与已建立的商业光伏模块相当,因此备受关注。成分工程是提高MHP太阳能电池性能的最有效方法之一。进一步提高MHP太阳能电池的效率和稳定性需要对MHP太阳能电池降解过程中的化学效率相关性和化学演化有很好的了解。在这方面,飞行时间二次离子质谱(ToF-SIMS)是研究MHPs化学方面的有力工具,并且在促进MHP光电技术的发展中发挥了重要作用。但是,到目前为止 缺少可指导将来在MHP开发中使用ToF-SIMS的评论。这里,从简单的材料合成和化学分布到更复杂的设备操作机制和稳定性,总结并分析了ToF-SIMS在MHP研究中的功能。着重说明了ToF-SIMS在解决该领域中重要问题方面的优势,例如界面组成,离子迁移和MHP降解。最后,提供了在开发MHP设备时最大程度地利用ToF-SIMS的前景。例如界面组成,离子迁移和MHP降解等。最后,提供了在开发MHP设备时最大程度地利用ToF-SIMS的前景。例如界面组成,离子迁移和MHP降解等。最后,提供了在开发MHP设备时最大程度地利用ToF-SIMS的前景。
更新日期:2020-08-26
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