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Identification of Synthetic Organic Pigments (SOPs) Used in Modern Artist's Paints with Secondary Ion Mass Spectrometry with MeV Ions.
Analytical Chemistry ( IF 6.7 ) Pub Date : 2020-06-02 , DOI: 10.1021/acs.analchem.0c01630
Matea Krmpotić 1 , Dubravka Jembrih-Simbürger 2 , Zdravko Siketić 1 , Nikola Marković 1 , Marta Anghelone 2 , Tonči Tadić 1 , Dora Plavčić 3 , Mason Malloy 4 , Iva Bogdanović Radović 1
Affiliation  

This work reports on the first systematic study using secondary ion mass spectrometry with MeV ions (MeV-SIMS) for analysis of synthetic organic pigments (SOPs) that can be usually found in modern and contemporary art paints. In order to prove the applicability of the method to different chemical classes of SOPs, 17 pigments were selected for the analyses. The focus was on blue and green phthalocyanines, yellow and red (naphthol AS) azo pigments, red quinacridone, anthraquinone, and diketopyrrolo-pyrrole pigments. Since there are no reference spectra available for this technique, pure pigment powders were measured first to create a database. Simple two-component paint systems were also prepared for testing purposes by mixing synthetic organic pigments with alkyd and acrylic binders. Commercial paints that contain the SOPs with identical C.I. numbers as in the prepared two-component samples were analyzed. All pigments were successfully identified in commercial products in the MeV-SIMS mass spectra through molecular and larger specific fragment ion peaks in the positive-ion mode. The main advantages of MeV-SIMS over other techniques used in SOPs identification, like pyrolysis gas chromatography mass spectrometry (Py-GC/MS), direct-temperature resolved mass spectrometry (DTMS), and laser desorption ionization mass spectrometry (LDIMS), can be summarized as follows: (i) pigments and binders can be detected simultaneously in the same mass spectrum acquired over a short measurement time (up to 500 s), (ii) only small sample flakes are required for the measurements, which are analyzed without any chemical treatment prior to the analyses, (iii) samples are not consumed during the analyses and can be reused for other measurements, e.g., multielemental analysis by other ion beam analysis (IBA) techniques, such as particle-induced X-ray emission (PIXE). Compared to, e.g., Raman spectroscopy, the significant benefit of MeV-SIMS is the exact identification of the SOPs in the paints even if pigments of similar structures are measured.

中文翻译:

借助MeV离子的二次离子质谱法鉴定现代艺术家涂料中使用的合成有机颜料(SOP)。

这项工作报告了第一次系统研究,该研究使用具有MeV离子的二次离子质谱(MeV-SIMS)分析合成有机颜料(SOP),通常可在现代和当代艺术涂料中找到这种合成有机颜料。为了证明该方法对不同化学类别的SOP的适用性,选择了17种颜料进行分析。重点是蓝色和绿色酞菁,黄色和红色(萘酚AS)偶氮颜料,红色喹ac啶酮,蒽醌和二酮吡咯并吡咯颜料。由于没有可用于该技术的参考光谱,因此首先测量纯颜料粉末以创建数据库。通过将合成有机颜料与醇酸和丙烯酸粘合剂混合,还为测试目的准备了简单的两组分涂料体系。包含具有相同CI的SOP的商业涂料 分析制备的两组分样品中的数量。通过正离子模式下的分子和更大的特定碎片离子峰,可以在MeV-SIMS质谱图中成功鉴定出商品中的所有颜料。MeV-SIMS相对于SOP鉴定中使用的其他技术的主要优势可以达到,例如热解气相色谱质谱(Py-GC / MS),直接温度分辨质谱(DTMS)和激光解吸电离质谱(LDIMS)。总结如下:(i)可以在短时间内(长达500 s)以相同的质谱图同时检测颜料和粘合剂,(ii)仅需要少量样品薄片进行测量,无需进行分析即可分析之前进行任何化学处理,(iii)在分析过程中不会消耗样品,并且可以将其重新用于其他测量,例如,通过其他离子束分析(IBA)技术进行的多元素分析,例如粒子诱导X射线发射(PIXE)。与拉曼光谱法相比,MeV-SIMS的显着优势是即使可以测量相似结构的颜料,也可以准确识别涂料中的SOP。
更新日期:2020-07-07
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