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Determining Surface Terminations and Chirality of Noncentrosymmetric FeGe Thin Films via Scanning Tunneling Microscopy.
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2020-02-13 , DOI: 10.1021/acsami.9b19724
Joseph P Corbett 1 , Tiancong Zhu 1 , Adam S Ahmed 1 , Steven J Tjung 1 , Jacob J Repicky 1 , Takahiro Takeuchi 2 , Jonathan Guerrero-Sanchez 3 , Noboru Takeuchi 3 , Roland K Kawakami 1 , Jay A Gupta 1
Affiliation  

Scanning tunneling microscopy was used to study the surfaces of 20-100 nm thick FeGe films grown by molecular beam epitaxy. An average surface lattice constant of ∼6.8 Å, in agreement with the bulk value, was observed via scanning tunneling microscopy, low energy electron diffraction, and reflection high energy electron diffraction. Each of the four possible chemical terminations in the FeGe films were identified by comparing atomic-resolution images, showing distinct contrast with simulations from density functional theory calculations. A detailed study of the atomic layering order and registry across step edges allows us to uniquely determine the grain orientation and chirality in these noncentrosymmetric films.

中文翻译:

通过扫描隧道显微镜确定非中心对称FeGe薄膜的表面端接和手性。

扫描隧道显微镜用于研究分子束外延生长的20-100 nm厚的FeGe薄膜的表面。通过扫描隧道显微镜,低能电子衍射和反射高能电子衍射观察到与本体值一致的平均表面晶格常数约为6.8。通过比较原子分辨率图像,可以确定FeGe膜中四种可能的化学终止基团,与密度泛函理论计算的模拟结果形成鲜明对比。对跨台阶边缘的原子分层顺序和配准的详细研究使我们能够唯一确定这些非中心对称薄膜的晶粒取向和手性。
更新日期:2020-02-14
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