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Nanoscale View of Dewetting and Coating on Partially Wetted Solids
The Journal of Physical Chemistry Letters ( IF 4.8 ) Pub Date : 2016-04-27 00:00:00 , DOI: 10.1021/acs.jpclett.6b00620 Yajun Deng 1 , Lei Chen 1 , Qiao Liu 1 , Jiapeng Yu 1 , Hao Wang 1
The Journal of Physical Chemistry Letters ( IF 4.8 ) Pub Date : 2016-04-27 00:00:00 , DOI: 10.1021/acs.jpclett.6b00620 Yajun Deng 1 , Lei Chen 1 , Qiao Liu 1 , Jiapeng Yu 1 , Hao Wang 1
Affiliation
There remain significant gaps in our ability to predict dewetting and wetting despite the extensive study over the past century. An important reason is the absence of nanoscopic knowledge about the processes near the moving contact line. This experimental study for the first time obtained the liquid morphology within 10 nm of the contact line, which was receding at low speed (U < 50 nm/s). The results put an end to long-standing debate about the microscopic contact angle, which turned out to be varying with the speed as opposed to the constant-angle assumption that has been frequently employed in modeling. Moreover, a residual film of nanometer thickness ubiquitously remained on the solid after the receding contact line passed. This microscopic residual film modified the solid surface and thus made dewetting far from a simple reverse of wetting. A complete scenario for dewetting and coating is provided.
中文翻译:
部分润湿的固体的去湿和涂层的纳米尺度视图
尽管在过去的一个世纪中进行了广泛的研究,但我们预测去湿和润湿的能力仍然存在巨大差距。一个重要的原因是缺乏有关移动接触线附近过程的纳米知识。这项实验研究首次获得了接触线10 nm以内的液体形貌,该形貌在低速(U<50 nm / s)。结果结束了关于微观接触角的长期争论,事实证明,微观接触角随着速度的变化而变化,而不是在建模中经常采用的恒定角度假设。此外,在后退的接触线通过之后,在固体上普遍残留有纳米厚度的残留膜。这种微小的残留膜会修饰固体表面,从而使除湿远非简单的反加湿。提供了用于润湿和涂层的完整方案。
更新日期:2016-04-27
中文翻译:
部分润湿的固体的去湿和涂层的纳米尺度视图
尽管在过去的一个世纪中进行了广泛的研究,但我们预测去湿和润湿的能力仍然存在巨大差距。一个重要的原因是缺乏有关移动接触线附近过程的纳米知识。这项实验研究首次获得了接触线10 nm以内的液体形貌,该形貌在低速(U<50 nm / s)。结果结束了关于微观接触角的长期争论,事实证明,微观接触角随着速度的变化而变化,而不是在建模中经常采用的恒定角度假设。此外,在后退的接触线通过之后,在固体上普遍残留有纳米厚度的残留膜。这种微小的残留膜会修饰固体表面,从而使除湿远非简单的反加湿。提供了用于润湿和涂层的完整方案。