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IEEE Journal of the Electron Devices Society
基本信息
期刊名称 | IEEE Journal of the Electron Devices Society IEEE J ELECTRON DEVI |
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期刊ISSN | 2168-6734 |
期刊官方网站 | https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245494 |
是否OA | Yes |
出版商 | Institute of Electrical and Electronics Engineers Inc. |
出版周期 | |
文章处理费 | 登录后查看 |
始发年份 | |
年文章数 | 92 |
影响因子 | 2.0(2023) scijournal影响因子 greensci影响因子 |
中科院SCI期刊分区
大类学科 | 小类学科 | Top | 综述 |
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工程技术3区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气3区 | 否 | 否 |
CiteScore
CiteScore排名 | CiteScore | SJR | SNIP | ||
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学科 | 排名 | 百分位 | 5.2 | 0.505 | 0.955 |
Materials Science Electronic, Optical and Magnetic Materials |
90/284 | 68% |
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Engineering Electrical and Electronic Engineering |
253/797 | 68% |
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Biochemistry, Genetics and Molecular Biology Biotechnology |
139/311 | 55% |
补充信息
自引率 | 5% |
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H-index | 23 |
SCI收录状况 |
Science Citation Index Expanded |
官方审稿时间 | 登录后查看 |
网友分享审稿时间 | 数据统计中,敬请期待。 |
接受率 | 登录后查看 |
PubMed Central (PMC) | http://www.ncbi.nlm.nih.gov/nlmcatalog?term=2168-6734%5BISSN%5D |
投稿指南
期刊投稿网址 | http://mc.manuscriptcentral.com/jeds |
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收稿范围 | The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC's, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original. All research papers benefit from rapid peer review and publication, and are deposited in IEEE Xplore. This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles accepted after 12 June 2019 are published under a CC BY 4.0 license*, and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given. Open access is provided through the payment of an article processing charge (APC) paid after acceptance. APCs are often financed by an author's institution or the funder supporting their research. *Articles accepted before 12 June 2019 were published under a CC BY 3.0 or the IEEE Open Access Publishing Agreement license. Questions about copyright policies or reuse rights may be directed to the IEEE Intellectual Property Rights Office at +1-732-562-3966 or copyrights@ieee.org. The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-anonymous peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance. Corresponding authors from low-income countries are eligible for waived or reduced APCs. |
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