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IEEE Design & Test
基本信息
期刊名称 | IEEE Design & Test IEEE DES TEST |
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期刊ISSN | 2168-2356 |
期刊官方网站 | https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221038 |
是否OA | No |
出版商 | IEEE Computer Society |
出版周期 | |
文章处理费 | 登录后查看 |
始发年份 | |
年文章数 | 59 |
影响因子 | 1.9(2023) scijournal影响因子 greensci影响因子 |
中科院SCI期刊分区
大类学科 | 小类学科 | Top | 综述 |
---|---|---|---|
工程技术3区 | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机:硬件3区 | 否 | 否 |
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气4区 |
CiteScore
CiteScore排名 | CiteScore | SJR | SNIP | ||
---|---|---|---|---|---|
学科 | 排名 | 百分位 | 2.12 | 0.356 | 1.515 |
Computer Science Hardware and Architecture |
51 / 152 | 66% |
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Computer Science Software |
147 / 360 | 59% |
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Engineering Electrical and Electronic Engineering |
199 / 661 | 69% |
补充信息
自引率 | 2.90% |
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H-index | 72 |
SCI收录状况 |
Science Citation Index Expanded |
官方审稿时间 | 登录后查看 |
网友分享审稿时间 | 数据统计中,敬请期待。 |
接受率 | 登录后查看 |
PubMed Central (PMC) | http://www.ncbi.nlm.nih.gov/nlmcatalog?term=2168-2356%5BISSN%5D |
投稿指南
期刊投稿网址 | |
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收稿范围 | IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards. |
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投稿指南 | |
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参考文献格式 | |
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