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Journal of Electron Spectroscopy and Related Phenomena
基本信息
期刊名称 Journal of Electron Spectroscopy and Related Phenomena
J ELECTRON SPECTROSC
期刊ISSN 0368-2048
期刊官方网站 https://www.sciencedirect.com/journal/journal-of-electron-spectroscopy-and-related-phenomena
是否OA No
出版商 Elsevier B.V.
出版周期 Monthly
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始发年份 1972
年文章数 74
影响因子 1.8(2023)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
物理4区 SPECTROSCOPY 光谱学4区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 3.3 0.506 0.680
Physics and Astronomy
Radiation
26/58 56%
Physics and Astronomy
Atomic and Molecular Physics, and Optics
116/224 48%
Physics and Astronomy
Condensed Matter Physics
227/434 47%
Materials Science
Electronic, Optical and Magnetic Materials
158/284 44%
Chemistry
Physical and Theoretical Chemistry
115/189 39%
补充信息
自引率 5.6%
H-index 80
SCI收录状况 Science Citation Index Expanded
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PubMed Central (PMC) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=0368-2048%5BISSN%5D
投稿指南
期刊投稿网址 https://www.editorialmanager.com/ELSPEC
收稿范围
The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.

The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.

The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.

Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis
收录体裁
投稿指南 https://www.sciencedirect.com/journal/journal-of-electron-spectroscopy-and-related-phenomena/publish/guide-for-authors
投稿模板
参考文献格式 https://www.elsevier.com/journals/journal-of-electron-spectroscopy-and-related-phenomena/0368-2048/guide-for-authors
编辑信息
Editors

W. Eberhardt

Inst. für Optik und Atomare Physik, Technische Universität Berlin (TUB), Straße des 17. Juni 135, 10623, Berlin, Germany Phone +49 (030) 314 29174 
A.P. Hitchcock
Brockhouse Institute for Materials Research (BIMR) and Department of Chemistry and Chemical Biology, McMaster University, 1280 Main St., Hamilton, L8S 4M1, Ontario, Canada, Fax: +1-905-5212773 
Inst. for Molecular Science (IMS), National Institutes of Natural Sciences, Nishigo-Naka 38, Myodaiji, 444-8585, Okazaki, Japan, Fax: +81-564-54-2254 Phone +81 564-55-7390
Honorary Board

C.R. Brundle

California, USA

G.E. McGuire

Research Triangle Park, North Carolina, USA

T. Ohta

Shiga, Japan

J.-J. Pireaux

Namur, Belgium
Editorial Board

H.W. Ade

North Carolina State University, Raleigh, North Carolina, USA

P.S. Bagus

University of North Texas, Denton, Texas, USA

H. Daimon

Nara Institute of Science and Technology, Ikoma Nara, Japan

F.M.F. de Groot

Universiteit Utrecht, Utrecht, Netherlands

H. Ebert

Ludwig-Maximilians-Universität München (LMU), Munich, Germany

C.S. Fadley

Lawrence Berkeley National Laboratory, Berkeley, California, USA

D.L. Feng

Fudan University, Shanghai, China

X. Gao

Chinese Academy of Sciences (CAS), Shanghai, China

M. Grioni

École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

U. Hergenhahn

Max Planck Institut (MPI) für Plasmaphysik, Greifswald, Germany

D.-J. Huang

National Synchrotron Radiation Reserach Center (NSRRC), , Hsinchu, Taiwan

S. Kera

Institute for Molecular Science, Okazaki, Japan

A. Kimura

Hiroshima University, Higashi-Hiroshima, Japan

K.T. Leung

University of Waterloo, Waterloo, Ontario, Canada

C. Miron

Synchrotron Soleil, Gif-sur-Yvette Cedex, France

S. Molodtsov

European X-ray Free Electron Laser (XFEL), Hamburg, Germany

A. Naves de Brito

Universidade Estadual de Campinas (UNICAMP), Campinas, Brazil

D. Prendergast

Lawrence Berkeley National Laboratory, Berkeley, California, USA

D.D. Sarma

Indian Institute of Science, Bangalore, India

T. Schmitt

Paul Scherrer Institut (PSI), Villigen, Switzerland

S. Suzer

Bilkent University, Ankara, Turkey

M. Vos

Australian National University, Canberra, Australian Capital Territory, Australia

P. Weightman

University of Liverpool, Liverpool, UK

W. Werner

Technische Universität Wien, Vienna, Austria

H.W. Yeom

Pohang University of Science and Technology, Nam-gu, Pohang, The Republic of Korea

M. Zharnikov

Ruprecht-Karls-Universität Heidelberg, Heidelberg, Germany


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