ICDD’s quarterly, (and a special topical issue) international journal, Powder Diffraction, focuses on materials characterization employing X-ray powder diffraction and related techniques. With feature articles covering a wide range of applications, from mineral analysis to epitactic growth of thin films to advances in application software and hardware, this journal offers a wide range of practical applications. ICDD, in collaboration with the Denver X-ray Conference Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis. Beginning in 2006, ICDD offered a copy of the previous year’s edition of AXA to Powder Diffraction institutional subscribers who receive both print and on-line versions.  This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis.Subject coverage includes:• Techniques and procedures in X-ray powder diffractometry• Advances in instrumentation• Study of materials including organic materials, minerals, metals and thin film superconductors• Publication of powder data on new materialsAuthors, subjects and page numbers are listed in the past issue content pages. Authors should read Notes for Authors for information on the scope, categories, manuscript preparation and submission to Powder Diffraction.

Editor-in-Chief
Camden Hubbard, Applied Diffraction Services, U.S.A.|camden.hubbard@me.com| 
camden.hubbard@me.com
Managing Editor
Nicole Ernst Boris, Managing Editor of Powder Diffraction|International Centre for Diffraction Data|12 Campus Blvd.|Newtown Square, PA 19073-3273|USA 
boris@icdd.com
Production Editor
Kayla Riddleberger, Cambridge University Press, U.S.A.|kriddleberger@cambridge.org ||
Editors for New Diffraction Data
Stacy Gates-Rector, International Centre for Diffraction Data, U.S.A.|gates-rector@icdd.com
Soorya Kabekkodu, International Centre for Diffraction Data, U.S.A.|kabekkodu@icdd.com|
Associate Editor for New Diffraction Data
Frank Rotella, Argonne National Laboratory (Retired), U.S.A.|fjrotella1949@gmail.com|
Editors
Xiaolong Chen, Institute of Physics, Chinese Academy of Sciences, China 
xlchen@iphy.ac.cn
José Miguel Delgado, Universidad de Los Andes, Venezuela 
migueld@ula.ve
Norberto Masciocchi, Università dell'Insubria, Italy 
norberto.masciocchi@uninsubria.it
Editors for Crystallography Education
James Kaduk, Poly Crystallography Inc., USA 
Kaduk@polycrystallography.com
Brian H. Toby, Argonne National Laboratory, USA 
brian.toby@anl.gov
International Reports Editor
Winnie Wong-Ng, National Institute of Standards and Technology, USA 
winnie.wong-ng@nist.gov
Calendar of Meetings and Workshops Editor
Gang Wang, Chinese Academy of Sciences, China 
gangwang@iphy.ac.cn
Advisory Board
Evgeny Antipov, Moscow State University, Russian Federation
Xiaolong Chen, Chinese Academy of Sciences, China
Jose Miguel Delgado, University de Los Andes, Venezuela
Steve Hillier, The James Hutton Institute, UK
Takashi Ida, Nagoya Institute of Technology, Japan
Aaron Johnson, Cambridge University Press, USA
Matteo Leoni, University of Trento, Italy
Marissa Murray-Harrison, Cambridge University Press, USA
Vanessa Peterson, Australian Nuclear Science and Technology Organisation, Australia
Mark Rodriguez, Sandia National Labs, USA
T.N. Guru Row, Indian Institute of Science, India