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Measurement
基本信息
期刊名称 Measurement
MEASUREMENT
期刊ISSN 1536-6367
期刊官方网站 https://www.sciencedirect.com/journal/measurement
是否OA No
出版商 Taylor and Francis Ltd.
出版周期 Bimonthly
文章处理费 登录后查看
始发年份
年文章数 1467
影响因子 5.2(2023)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
工程技术3区 ENGINEERING, MULTIDISCIPLINARY 工程:综合3区
INSTRUMENTS & INSTRUMENTATION 仪器仪表3区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 1.8 0.327 0.528
Social Sciences
Education
843/1543 45%
Mathematics
Statistics and Probability
154/278 44%
Mathematics
Applied Mathematics
382/635 39%
补充信息
自引率 11.5%
H-index 70
SCI收录状况 Science Citation Index Expanded
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PubMed Central (PMC) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=0263-2241%5BISSN%5D
投稿指南
期刊投稿网址 https://www.editorialmanager.com/MEAS
收稿范围
Journal of the International Measurement Confederation (IMEKO)



Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material representing achievements in the field, whose ultimate goal is an enhancement of the state-of-the-art of subjects such as: measurement and metrology fundamentals, measurement science, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures for performance analysis of measurement systems, processes and algorithms, mathematical models for measurement-oriented purposes, and distributed measurement systems in a connected world.


Notes:
Papers including measurement results that, although important to validate any given scientific study but which offer no new insights in an area different from measurement science or technology, do not fall within the scope of this journal;
The disciplined usage of well-known metrological terms is strongly required. Authors can access information on all relevant terms such as measurement accuracy, uncertainty, the law of propagation of uncertainty and other, similar terms: these are defined in internationally approved guidelines such as the International Vocabulary of Metrology (VIM) and Guide to the Expression of Uncertainty in Measurement (GUM), which are freely available on https://www.bipm.org/en/publications/guides/;
The paper must clearly describe the measurement context in which the research was carried out by undertaking a critical review of the state-of-the-art of the relevant body of knowledge in instrumentation and measurement and by showing how the research presented advances it;
The letter accompanying the submission must describe clearly how the paper satisfies the above requirements.


Papers that focus on image processing or fault diagnosis with little or no elements of measurement science or technology will not be considered within the journal scope.

Authors please note:
The journal Measurement is receiving an increasing number of papers in the area of machine learning/neural networks and other techniques based on artificial intelligence. These submissions will be desk rejected unless they:
prove that the described research advances the state-of-the-art in measurement science and is not just an application of an available tool to known or novel problems, that is used without an appreciation of measurement-related aspects;
show that the usage of these tools is put into the correct measurement-related context and not just in the context of machine-learning/neural network applications;
contain enough information about the used tools, data, and results to allow, in principle, anyone to replicate the described results;
display the use of specific metrics to strengthen the results of research activities.


It must be recalled that Measurement is interested in publishing new methods, techniques, procedures, algorithms, and alike that show how to better measure in nature and in the world. Thus, the capability to describe metrological-related details of the proposed research represents a major difference between papers published by this journal and by other journals publishing papers on similar topics. This major difference must be evident also in papers covering applications of machine learning and soft computing techniques. Failing to adhere to these guidelines will result in a paper desk-reject decision.

Authors whose manuscripts focus on the research, development and application of the science, engineering and technology of sensors and sensor systems, are welcome to submit to the journal's open access companion title, Measurement: Sensors.

Authors whose manuscripts focus on food and nutrition measurements may also wish to submit to the journal's second open access companion title, Measurement: Food.
收录体裁
original research papers, reviews, letters and short communications
投稿指南 https://www.sciencedirect.com/journal/measurement/publish/guide-for-authors
投稿模板
参考文献格式 https://www.elsevier.com/journals/measurement/0263-2241/guide-for-authors
编辑信息
Editor-in-Chief

Professor Paolo Carbone

University of Perugia, Perugia, Italy
Editors

L. DeVito

University of Sannio, Italy

E. Drakakis

Imperial College London, London, United Kingdom

A. Lay-Ekuakille

University of Salento, Lecce, Italy

J. Li

University of Waterloo Department of Geography and Environmental Management, Waterloo, Ontario, Canada

D. Macii

University of Trento, Trento, Italy

A. Marconnet

Purdue University, West Lafayette, Indiana, United States

T. Sarkodie-Gyan

University of Texas at El Paso College of Engineering, El Paso, Texas, United States

S. Vanlanduit

University of Antwerp, Antwerpen, Belgium

Y. Yan

University of Kent, Canterbury, United Kingdom
Associate Editors

B. Cukurel

Technion Israel Institute of Technology, Haifa, Israel

P. Degenaar

Newcastle University, Newcastle, United Kingdom

A. Glowacz

AGH University of Science and Technology, Poland

Y. H. Hu

North China Electric Power University, Beijing, China

Yu Kong

Rochester Institute of Technology, Rochester, New York, United States

G. Krolczyk

Opole University of Technology, Poland

M. Laracca

University of Cassino and Southern Lazio, Italy

Z. Li

China University of Mining and Technology, Xuzhou, China

W. K. Ling

Guangdong University of Technology - University Town Campus, Guangzhou, China

K.I. Papadimitriou

University College London, London, United Kingdom

K. Polat

Abant Izzet Baysal University, Bolu, Turkey

P.K. Rachakonda

National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, Maryland, United States

T.G. Santos

New University of Lisbon, Portugal

M. Schoukens

University of Technology Eindhoven, Eindhoven, Netherlands

R. Trouillon

French Alternative Energies and Atomic Energy Commission Electronics and Information Technology Laboratory, Grenoble, France

R. Velazquez

Panamerican University - Mexico Campus, Ciudad de Mexico, Mexico

L. Villafane

University of Illinois at Urbana-Champaign Department of Aerospace Engineering, Urbana, Illinois, United States

C. L. Xu

Southeast University, Nanjing, China

T.-H. Yi

Dalian University of Technology, Dalian, China

X. Yue

University of the West of England Bristol, United Kingdom

N. Yusa

Tohoku University, Japan
Membership of the Board

S. Bennett

National Physical Laboratory, Teddington, United Kingdom

N. Fox

National Physical Laboratory, Teddington, United Kingdom

R.Z. Morawski

Warsaw University of Technology Institute of Radioelectronics and Multimedia Technology, Warsaw, Poland

A. Wallard

National Physical Laboratory, Teddington, United Kingdom
Ex-Officio Membership of the Board

Dr. L. Borbas

Budapest University of Technology and Economics, Budapest, Hungary

Professor M. Borsic

Croatian Metrology Society, Zagreb, Croatia

Dr. I. Castanheira

National Institute of Health Doctor Ricardo Jorge, Lisboa, Portugal

Professor M. Catelani

University of Florence, Firenze, Italy

Professor D. Dallet

Community of Universities and Institutions of Aquitaine, Bordeaux, France

Professor P. Daponte

University of Sannio, Benevento, Italy

Prof. Dr. R.X. Fernandes

National Metrology Institute of Germany, Braunschweig, Germany

Professor K.T.V. Grattan

City University of London, London, United Kingdom

Professor M. Ishikawa

Japan

Dr. T. Kobata

National Institute of Advanced Industrial Science and Technology Tsukuba Center Tsukuba Central, Tsukuba, Japan

Professor Y. Koike

Tokyo Institute of Technology - Suzukakedai Campus, Yokohama, Japan

Dr. R. Kumme

National Metrology Institute of Germany, Braunschweig, Germany

Dr. R.R. Machado

National Institute of Metrology Quality and Technology, RIO DE JANEIRO, Brazil

Dr. F. Pavese

National Institute of Metrological Research, Torino, Italy

Dr. M.J. Reader-Harris

National Engineering Laboratory Ltd. (NEL), Glasgow, United Kingdom

Professor P.P.I. Regtien

The Netherlands

Dr. G. Ripper

National Institute of Metrology Quality and Technology, RIO DE JANEIRO, Brazil

Dr. M. Rosenberger

Technical University of Berlin, Berlin, Germany

Professor G.B. Rossi

eCampus University, Novedrate, Italy

Dr. M. Sega

National Institute of Metrological Research, Torino, Italy

Professor R. Summers

Loughborough University, Loughborough, United Kingdom

Professor S. Tachi

The University of Tokyo, Bunkyo-Ku, Tokyo, Japan

Professor Y. Takaya

Osaka University, Suita, Japan

Dr. Y.H. Yim

Korea Research Institute of Standards and Science

Professor B. Zagar

Johannes Kepler University Linz, Linz, Austria

Professor D. Zvizdic

University Hospital Centre Zagreb, Zagreb, Croatia
Emeritus Editor

Professor K.T.V. Grattan

City, University of London, London, United Kingdom


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