Editor-in-Chief: C. Barry Carter University of Connecticut Storrs, CT, USA Deputy Editors-in-Chief: Christopher F. Blanford The University of Manchester, Manchester, UK M. Grant Norton Washington State University, Pullman, WA, USA Editors: Antonia Antoniou Georgia Institute of Technology, Atlanta, GA, USA Mark Bissett The University of Manchester, Manchester, UK Kyle S. Brinkman Clemson University, Clemson, SC, USA Pedro Camargo University of Helsinki, Helsinki, Finland David P. Cann Oregon State University, Corvallis, OR, USA Chris Cornelius University of Nebraska, Lincoln, NE, USA João Quinta da Fonseca The University of Manchester, Manchester, UK Shen Dillon University of Illinois at Urbana-Champaign, Urbana, IL, USA Avinash Dongare University of Connecticut, Storrs, CT, USA Stephen J. Eichhorn University of Bristol, Bristol, UK Jaime Grunlan Texas A&M, College Station, TX, USA Dale L. Huber Sandia National Laboratories, Albuquerque, NM, USA Maude Jimenez Université Lille 1, Villeneuve d'Ascq, France Kevin Jones University of Florida, Gainesville, FL, USA Nathan A. Mara University of Minnesota, Minneapolis, MN, USA Philip Nash Illinois Institute of Technology, Chicago, IL, USA Corinne E. Packard Colorado School of Mines, Golden, CO, USA Sophie Primig University of South Wales, Sydney, Australia N. Ravishankar Indian Institute of Science, Bangalore, India Greg Rutledge MIT, Cambridge, MA, USA Annela M. Seddon Bristol University, Bristol, UK Yujie Xiong USTC, Hefei, China Yaroslava Yingling North Carolina State University, Raleigh, NC, USA Naiqin Zhao Tianjin University, Tianjin, China Invited Reviews Editors: Philip Nash Illinois Institute of Technology, Chicago, IL, USA Editorial Board:
A.K. Bhowmick,Indian Institute of Technology, Kharagpur, India; A. Boccaccini, University of Erlangen-Nuremberg, Germany;D. Chatain, CNRS, Marseilles, France;K. Chawla,University of Alabama atBirmingham, USA; R.F. Cook, National Institute of Standards and Technology, Gaithersburg, MD; D.Dimos,The University of Texas Arlington, USA; E. Eustathopolous, CNRS, Grenoble, France;R. W.Grimes,Imperial College, London, UK; Y. Ikuhara, University of Tokyo, JFCC-Nagoya, and Tohoku University, Japan;W.D. Kaplan, Technion-Israel Institute of Technology, Haifa, Israel; H.S. Kim, POSTECH, Pohang, South Korea; K. Krishnan,University ofWashington, Seattle, USA; T.G. Langdon,University ofSouthampton, UK; Y-W Mai, The University of Sydney, Australia; A. Passerone, CNR, Genova, Italy;E. Rabkin,Technion- Israel Institute of Technology,Haifa, Israel; H. Saka, Nagoya University, Japan; G. Solórzano, Pontificia Universidade Católica (PUC) Rio de Janeiro, Brazil; A.C. Taylor, Imperial College, London, UK; Z.L. Wang,Georgia Institute of Technology,Atlanta, USA;Y.T. Zhu, North Carolina State University, Raleigh, NC, USA
Distinguished Advisory Board:
R. Abbaschian, University of California, Riverside, CA, USA; W. Bonfield, (Chairman) University of Cambridge, UK; E. Baer,Case Western Reserve University, Cleveland, OH, USA;W. C. Carter, Massachusetts Institute of Technology, Cambridge, MA, USA; K. Chattopadhyay, Indian Institute of Science, Bangalore, India; G. Eggeler, Institut fur Werkstoffe, Bochum, Germany; J. H. Evans-Freeman, University of Canterbury, Canterbury, NZ; L.C.Feldman,Rutgers University, Piscataway, NJ, USA; D. Fray,University of Cambridge, UK; K. Friedrich,Kaiserslautern University,Germany; C.M. Hansson,University of Waterloo, ON, Canada; Z. Munir, University of California, Davis, CA;T.F. Page, University of Newcastle upon Tyne, UK;R. O. Ritchie, University of California, Berkeley, CA, USA; C. Russel, Friedrich-Schiller-University, Jena, Germany;A.P. Tomsia, Lawrence Berkeley National Laboratory, Berkeley, CA, USA; A.F.W.Willoughby, University of Southampton, UK; Robert J. Young, The University of Manchester, UK
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