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Journal of Physical and Chemical Reference Data
基本信息
期刊名称 Journal of Physical and Chemical Reference Data
J PHYS CHEM REF DATA
期刊ISSN 0047-2689
期刊官方网站 http://scitation.aip.org/content/aip/journal/jpcrd
是否OA No
出版商 American Institute of Physics
出版周期 Quarterly
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始发年份 1972
年文章数 18
影响因子 4.4(2023)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
工程技术2区 CHEMISTRY, MULTIDISCIPLINARY 化学综合3区
CHEMISTRY, PHYSICAL 物理化学3区
PHYSICS, MULTIDISCIPLINARY 物理:综合2区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 6.9 0.746 2.415
Physics and Astronomy
General Physics and Astronomy
41/243 83%
Chemistry
General Chemistry
93/408 77%
Chemistry
Physical and Theoretical Chemistry
45/189 76%
补充信息
自引率 11.4%
H-index 85
SCI收录状况 Science Citation Index Expanded
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PubMed Central (PMC) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=0047-2689%5BISSN%5D
投稿指南
期刊投稿网址 http://jpcrd.peerx-press.org/cgi-bin/main.plex
收稿范围
The Journal of Physical and Chemical Reference Data (JPCRD) is published by AIP Publishing for the U.S. Department of Commerce National Institute of Standards and Technology (NIST). The journal provides critically evaluated physical and chemical property data, fully documented as to the original sources and the criteria used for evaluation, preferably with uncertainty analysis. Critical reviews may also be included if they document a reference database, review the data situation in a field, review reference-quality measurement techniques, or review data evaluation methods. Manuscripts reporting correlations of data or estimation methods are acceptable only if they are based on critical data evaluation and if they produce reference data—the best available values for the relevant properties. JPCRD does not normally publish original experimental measurements, such as those normally reported in the primary research literature, with the exception of experiments that establish definitive values (with well-characterized uncertainties) that can be used as a reference in other contexts such as calibration of instruments.
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Co-Editors-in-Chief

Donald R. Burgess, Jr.
National Institute of Standards and Technology, Gaithersburg, MD, USA

Allan H. Harvey
National Institute of Standards and Technology, Boulder, CO, USA


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