TOPIC 1. Grazing Incidence X-Ray Scattering (GIXS: GISAXS, GIWAXS) structural simulation
TOPIC 2. Structure-Performance Correlations and Degradation Kinetics of Nano-Optoelectronic Thin Films [NSFC]
TOPIC 3. Colloidal Quantum Dot Short-Wave Infrared Detection and Imaging Technology [SZTU Top-Talent Program]
TOPIC 4. High-Resolution Imaging Chip Integration and Packaging Technology [Shenzhen Science and Technology Program]