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Fault Injection Caused by Phase-Locked Loop Compromised With IEMI
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-10-03 , DOI: 10.1109/temc.2024.3468337 Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi
中文翻译：
受 IEMI 影响的锁相环引起的故障注入
更新日期：2024-10-03
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-10-03 , DOI: 10.1109/temc.2024.3468337 Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi
中文翻译：
受 IEMI 影响的锁相环引起的故障注入
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