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Review—Radiation Shielding Properties of Tellurite and Silicate Glass
ECS Journal of Solid State Science and Technology ( IF 1.8 ) Pub Date : 2022-07-29 , DOI: 10.1149/2162-8777/ac81ea
Floressy Juhim , Fuei Pien Chee , Asmahani Awang , Mivolil Duinong , Rosfayanti Rasmidi , Muhammad Izzuddin Rumaling

Silicate glass is one of the popular radiation shielding materials due to its abundance on Earth. However, due to fabrication simplicity, tellurite-based optical glass materials became the primary glass network forming, garnering great scientific and technological relevance for their future uses. Previous studies stated that the silicate and tellurite glass system might be employed in shielding applications, with metal oxide concentrations balanced with SiO2 and TeO2 content. The inclusion of SiO2 and TeO2 in the glass composition reduces the impact of radiation. In electron radiation, electron interaction activities with glass are more substantial in the low electron energy area. Meanwhile, the proton attenuation factors of the glass samples are smaller than the electrons. There is no discernible difference in the fast neutron effective removal cross-section (ΣR) values of the glass samples in neutron radiation. In the studies of tellurite glasses for gamma radiation shielding, the photon interaction parameters change as a function of material density. The measurements show that adding TeO2 to glass samples improved the gamma protection characteristics of the glasses. This review aims to explain the various material compositions and discuss a more in-depth analysis of radiation shielding properties in the silicate and tellurite glasses.

中文翻译:

综述——亚碲酸盐和硅酸盐玻璃的辐射屏蔽性能

硅酸盐玻璃因其在地球上的丰富性而成为流行的辐射屏蔽材料之一。然而,由于制造简单,基于亚碲酸盐的光学玻璃材料成为主要的玻璃网络形成,对其未来的使用具有重要的科学和技术意义。先前的研究表明,硅酸盐和亚碲酸盐玻璃系统可用于屏蔽应用,其中金属氧化物浓度与 SiO 2和 TeO 2含量平衡。SiO 2和TeO 2的夹杂物在玻璃成分中减少辐射的影响。在电子辐射中,电子与玻璃的相互作用活动在低电子能量区域更为显着。同时,玻璃样品的质子衰减因子小于电子。玻璃样品在中子辐射下的快中子有效去除截面 (ΣR) 值没有明显差异。在用于伽马辐射屏蔽的亚碲酸盐玻璃的研究中,光子相互作用参数随材料密度而变化。测量表明,添加 TeO 2玻璃样品改善了玻璃的伽马保护特性。本综述旨在解释各种材料成分,并讨论对硅酸盐和亚碲酸盐玻璃的辐射屏蔽特性进行更深入的分析。
更新日期:2022-07-29
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