Time-Resolved Orientation and Phase Analysis of Lead Halide Perovskite Film Annealing Probed by In Situ GIWAXS,Advanced Optical Materials

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Time-Resolved Orientation and Phase Analysis of Lead Halide Perovskite Film Annealing Probed by In Situ GIWAXS
Advanced Optical Materials ( IF 8.0 ) Pub Date : 2022-04-03 , DOI: 10.1002/adom.202102722
Manuel A. Reus ₁ , Lennart K. Reb ₁ , Alexander F. Weinzierl ₁ , Christian L. Weindl ₁ , Renjun Guo ₁ , Tianxiao Xiao ₁ , Matthias Schwartzkopf ₂ , Andrei Chumakov ₂ , Stephan V. Roth ₂ , Peter Müller‐Buschbaum _{1,

3}

Affiliation

Scalable thin-film deposition methods are increasingly important for hybrid lead halide perovskite thin films. Understanding the structure evolution during non-equilibrium processes helps to find suitable materials and processing parameters to produce films with well-performing optoelectronic properties. Here, spin-cast and slot-die coated bilayers of lead iodide (PbI₂) and methylammonium iodide (MAI) are investigated by in situ grazing-incidence wide-angle X-ray scattering during the thermal annealing process, which converts the bilayer into methylammonium lead iodide (MAPI). Photoluminescence (PL) and UV/Vis measurements show increasing crystallinity during the annealing process and a slight PL red-shift of the spin-cast film, attributed to crystallite coalescence that is not prominent for the slot-die coated film. The disintegration of the solvent-precursor complex (MA)₂(Pb₃I₈) ⋅ 2 DMSO and conversion into perovskite are followed in situ and differences in the morphology and time evolution are observed. In both, spin-cast and slot-die coated thin-films, the isotropic orientation is dominant, however, in the slot-die coated films, the perovskite crystallites have an additional face-on orientation ((110) parallel to substrate) that is not detected in spin-cast films. An Avrami model is applied for the perovskite crystal growth that indicates reduced dimensionality of the growth for the printed thin films.

中文翻译：

原位 GIWAXS 探测卤化铅钙钛矿薄膜退火的时间分辨取向和相位分析

可扩展的薄膜沉积方法对于混合卤化铅钙钛矿薄膜越来越重要。了解非平衡过程中的结构演化有助于找到合适的材料和工艺参数来生产具有良好光电性能的薄膜。在这里，旋转铸造和缝模涂层的碘化铅双层（PbI ₂) 和甲基碘化铵 (MAI) 在热退火过程中通过原位掠入射广角 X 射线散射进行研究，将双层转化为甲基碘化铅 (MAPI)。光致发光 (PL) 和 UV/Vis 测量显示，在退火过程中结晶度增加，旋涂薄膜有轻微的 PL 红移，这归因于微晶聚结，这对于缝模涂层薄膜来说并不突出。溶剂-前体复合物 (MA) ₂ (Pb ₃ I _{8 ) 的分解}) ⋅ 原位跟踪 2 DMSO 和转化为钙钛矿，并观察到形态和时间演化的差异。在旋转浇注和缝模涂层薄膜中，各向同性取向占主导地位，然而，在缝模涂层薄膜中，钙钛矿微晶具有额外的正面取向（（110）平行于基板），在旋转流延薄膜中未检测到。Avrami 模型应用于钙钛矿晶体生长，表明印刷薄膜的生长维度降低。

更新日期：2022-04-03

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