张媛媛 - 华东师范大学 - 物理与电子科学学院

个人简介

教育经历 2004-2009 中国科学院上海硅酸盐研究所博士 2000-2004 郑州大学学士

研究领域

新型磁电复合薄膜的制备及物理特性

近期论文

查看导师最新文章（温馨提示：请注意重名现象，建议点开原文通过作者单位确认）

Yuanyuan Zhang, G. S. Wang, Y. Chen, F. Cao, L. H. Yang, and X. L. Dong, Effect of Donor, Acceptor, and Donor-Accept Codoping on the Electrical Properties of Ba0.6Sr0.4TiO3 thin films for Tunable Device Applications ceramics, J. Am. Ceram. Soc., 92, 2759-2761 (2009); Yuanyuan Zhang, G. S Wang, Y. Chen, L. H. Yang, F. Cao, and X. L. Dong, Highly Temperature Stable Dielectric Properties of Nanograin Barium Strontium Titanate Thin films Grown on Silicon Substrate, J. Am. Ceram. Soc., 92, 2795-2797 (2009); Qing Ren, Yuanyuan Zhang*, Ying Chen, Genshui Wang, Xianlin Dong, Xiaodong Tang, Structure and magnetic properties of La0.67Sr0.33MnO3 thin films prepared by sol–gel method, J. Sol-Gel. Sci. Technol., 67, 170–174, (2013); Y. Chen, Yuanyuan Zhang, X. L. Dong, G. S. Wang, and F. Cao, Microstructure - dielectric properties relationship in Al2O3 doped Ba0.6Sr0.4TiO3- Mg2SiO4 composite ceramics, J. Am. Ceram. Soc., 93, 161-166 (2010); L. H. Yang, G. S. Wang, C. L. Mao, Yuanyuan Zhang, R. L. Liang, C. Soyer, D. Rémiens, X. L. Dong, Orientation control of LaNiO3 thin films by RF magnetron sputtering with different oxygen partial pressure, J. Cryst. Growth, 311, 4241-4246 (2009); S. Zhang, X. L. Dong, Y. Chen, F. Cao, Yuanyuan Zhang, G. S. Wang, Nossikpendou Sama, and Denis Remiens, Growth and Electric Properties of MPB BiScO3-PbTiO3 Thin Films on La0.7Sr0.3MnO3-Coated Silicon Substrates, J. Am. Ceram. Soc., 93, 1583-1585 (2010); W. F. Xu, J. Yang, W. Bai, K. Tang, Yuanyuan Zhang, and X. D. Tang, Oxygen vacancy induced photoluminescence and ferromagnetism in SrTiO3 thin films by molecular beam epitaxy, J. Appl. Phys., 114, 154106 (2013); J. Liu, W. Bai, J. Yang, W. F. Xu, Yuanyuan Zhang, T. Lin, X. J. Meng, C. G. Duan, X. D. Tang, and J. H. Chu The Cr-substitution concentration dependence of the structural, electric and magnetic behaviors for Aurivillius Bi5Ti3FeO15 multiferroic ceramics, J. Appl. Phys., 114, 234101 (2013);