个人简介
學歷
•淡江大學博士
•清華大學碩士
•東吳大學學士
經歷
•國立清華大學統計學研究所教授，1995/08~迄今
•國立清華大學統計學研究所所長，1998/08~2000/07
•國立臺灣科技大學工業管理技術系教授，1989/08~1995/07
•國立臺灣科技大學工業管理技術系副教授，1983/02~1989/07
•國立臺灣科技大學工業管理技術系講師，1982/08~1983/01
•私立東吳大學商用數學系講師，1977/08~1982/07
教授課程
•應用機率模型、反應曲面方法
研究成果
Working papers and others (技術報告及其它)
(1) Tseng, S. T. (2016), “Optimal Design and Analysis of Accelerated Trend renewal Process.” MOST-1105-2118-M-007-003-MY2.
(2) Tseng, S. T. (2013), “Field failure rate prediction based on lab testing data.” NSC-102-2118-M-007-001-MY3.
(3) Tseng, S. T. (2012). “Run-to-Run control scheme for a dynamic system subject to mixed runs.” NSC-100-2221-E-007-060-MY3.
(4) Tseng, S. T. (2011). “A robust design of MEWMA controller for drifted MIMO Systems.” NSC-97-2221-E-007-096-MY3.
(5) Tseng, S. T. (2010). “Mis-specification analysis of linear degradation models.” NSC-96-2628-M-007-014-MY3.
近期论文
查看导师最新文章
（温馨提示：请注意重名现象，建议点开原文通过作者单位确认）
•A. Journal Papers(期刊論文)
(1) Tseng, S. T.* and Chen, P. Y. (2017), “A generalized quasi-MMSE controller for run-to-run dynamic models.” To appear in Technometrics, NSC 100-2221-E-007-060-MY3. (SCI)
(2) Yao, Y. C., Tseng, S. T.*, and Wong, D. S. H. (2017), “Shelf-life prediction of nano-sol via pH acceleration.” To appear in Journal of Quality Technology, MOST 105-2118-M-007-003-M2. (SCI)
(3) Tseng, S. T.*, Hsu, N. J., and Lin Y. C. (2016), “Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products." IIE Transactions, 48(8), 710-719, NSC-102-2118-M-001-MY3. (SCI)
(4) Tseng, S. T.* and Lee, I. C. (2016), “Optimum allocation rule for accelerated degradation tests with a class of exponential-dispersion degradation models.” Technometrics, 58(2), 244-254, NSC 102-2118-M-007-001-MY3. (SCI)
(5) Tseng, S. T.*, Mi, H. C., and Lee, I. C. (2016), “A multivariate EWMA controller for linear dynamic processes.” Technometrics, 58(1), 104-115, NSC 100-2221-E-007-060-MY3. (SCI)
(6) Hsu, N. J., Tseng, S. T.* and Chen M. W. (2015), “Adaptive warranty prediction for highly reliable products." IEEE Transactions on Reliability, 64(3), 1057-1067, NSC-102-2118-M-001-MY3. (SCI)
(7) Zou, C. L., Tseng, S. T.* and Wang, Z. J. (2014), “Outlier detection in general profiles using penalized regression method.” IIE Transactions (Focus on Quality and Reliability Engineering), 46, 106-117, (SCI)
(8) Tseng, S. T.* and Mi, H. C. (2014), “Quasi MMSE run-to-run controller for dynamic models.” IIE Transactions, 46, 185-196, (SCI)
(9) Tsai, C. C., Tseng, S. T.*, Balakrishnan, N. and Lin, C. T. (2013), “Optimal design for accelerated destructive degradation tests.” Quality Technology and Quantitative Management, 10(3), 263-276, (SCI)
(10) Peng, C. Y., and Tseng, S. T.* (2013), “Statistical lifetime inference for Skew-Wiener linear degradation models.” IEEE Transactions on Reliability, NSC-96-2628-M-007-014-MY3, 62(2), 338-350, (SCI)
(11) Lin, C. H., Tseng, S. T.*, and Wang, H. F. (2013), “Modified EWMA controller subject to metrology delay.” IIE Transactions (Focus on Quality and Reliability Engineering), NSC-100-2221-E-007-060-MY3, 45(4), 409-421, (SCI)
(12) Tsai, C. C., Tseng, S. T.*, and Balakrishnan, N. (2012), “Optimal design for degradation tests based on gamma processes with random effects.” IEEE Transactions on Reliability, NSC-96-2628-M-007-014-MY3, 61(2), 604-613, (SCI)
(13) Jou, B. Y., Chan, Y. T., and Tseng, S. T.* (2012), “Designing a variable EWMA controller for the process disturbance subject to linear drift and step changes.” IEEE Transactions on Semiconductor Manufacturing, 25(4), 614-622. NSC-99-2118-M-007-002-MY3, (SCI)
(14) Tsai, C. C., Tseng, S. T.* and Balakrishnan, N. (2011a), “Mis-specification analyses of gamma and Wiener degradation processes.” Journal of Statistical Planning and Inference, 141, 3725-3735, NSC-96-2628-M-007-014-MY3, (SCI)
(15) Lee, S. P., Chao A. K. , Tsung, F., Wong, DSH, Tseng, S. T.* and Jang S. S. (2011), “Monitoring batch process with multiple on-off steps in semiconductor manufacturing.” Journal of Quality Technology, 43(2), 142-157, (SCI)
(16) Tsai, C. C., Tseng, S. T.* and Balakrishnan, N. (2011b), “Optimal burn-in policy for highly reliable products using gamma degradation process.” IEEE Transactions on Reliability, 60(1), 234-245, NSC-96-2628-M-007-014-MY3, (SCI)
•B. Conference Papers
(1) Tseng, S. T. (2016). “Shelf-life Prediction of Nano-sol via pH Acceleration.” 4th ICISE Conference, June 22-24, Sicily, Italy.
(2) Tseng, S. T. (2015). “Joint Inference of lab and field data with application to warranty prediction.” 60th World Statistics Congress of ISI, Rio de Janeiro, July 26-31, Brazil.
(3) Tseng, S. T. (2014). “Field failure rate prediction for highly reliable products.” COMPSTAT, Geneva, August 17-23, Switzerland.
(4) Tseng, S. T. (2013), “Optimal sample allocation for accelerated degradation test with exponential-dispersion model.” Stellenbosch, July 1-4, South Africa.
(5) Tseng, S. T. (2012), “Optimal design for degradation tests based on gamma processes with random effects.” Bordeaux, July 4-6, France.
(6) Tseng, S. T. (2011), “Mis-specification analysis of Inverse Gaussian with Gamma Processes,” 57th ISI Conference, Dublin, August 22-27, Ireland.
京公网安备 11010802027423号